XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation

· Source: Computer Vision and Pattern Recognition · Field: Technology & Digital — Artificial Intelligence & Machine Learning, Computer Vision & Pattern Recognition · Depth: Expert, quick

Summary

XCT-SAM introduces a sequential parameter-efficient adaptation framework designed for industrial X-ray computed tomography (XCT) defect segmentation in additive manufacturing (AM). This addresses challenges like severe class imbalance and large distribution shifts, which cause foundation models like the Segment Anything Model (SAM) to perform poorly due to their natural-image pre-training. Instead of direct adaptation, XCT-SAM first fine-tunes Conv-LoRA adapters on an alloy-microstructure dataset, then transfers the adapted model to XCT images, progressively bridging the domain gap. Using Conv-LoRA with rank r=2, the framework trains approximately 4.15M parameters while keeping over 99% of SAM frozen. Evaluated on CycleGAN-XCT benchmarks and real-world NIST XCT scans, XCT-SAM consistently outperforms zero-shot SAM and other domain-adapted baselines, achieving superior IoU and Dice scores.

Key takeaway

For Machine Learning Engineers adapting foundation models like SAM to specialized industrial domains with limited labeled data, XCT-SAM's sequential, parameter-efficient approach offers a robust strategy. You should explore multi-stage domain adaptation with Conv-LoRA to inject spatial inductive bias and progressively bridge large domain gaps, significantly improving performance on challenging industrial XCT defect segmentation tasks.

Key insights

Sequential parameter-efficient domain adaptation effectively bridges large domain gaps for specialized image segmentation.

Principles

Method

Fine-tune Conv-LoRA adapters on an intermediate alloy-microstructure dataset, then transfer the adapted model to target XCT images to progressively bridge the domain gap.

In practice

Topics

Code references

Best for: Research Scientist, AI Scientist, Machine Learning Engineer, Computer Vision Engineer

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Editorial summary, takeaway, and curation by AIssential. Original article published by Computer Vision and Pattern Recognition.