From Forgeries to Foundation Models: A Systematic Survey of Identity Document Attack and Detection

· Source: Computer Vision and Pattern Recognition · Field: Technology & Digital — Artificial Intelligence & Machine Learning, Cybersecurity & Data Privacy, Computer Vision & Pattern Recognition · Depth: Expert, quick

Summary

A systematic survey, "From Forgeries to Foundation Models," analyzes the fundamental shift in identity document forgery. Generative AI tools now enable high-fidelity synthesis and manipulation, while detection methods are constrained by outdated benchmarks. The survey unifies Presentation Attacks, Digital Injection Attacks, and GenAI-driven synthesis within a single threat model. It traces detection methodologies from rule-based heuristics to foundation models. An audit of 2019-2025 public datasets reveals a "Reality Gap" between benchmarks and operational deployment. The survey identifies "Script-Dependent Generative Instability (SDGI)" in non-Latin script inpainting. It also notes that even strong models achieve APCER values above 25% on unseen synthesized IDs.

Key takeaway

For AI Security Engineers developing identity verification systems, you must urgently update your threat models and evaluation frameworks. Current detection methods are insufficient against advanced generative AI attacks. This is evidenced by the "Reality Gap" in benchmarks and APCER values exceeding 25% for strong models. Prioritize forensically grounded, privacy-preserving, and legally accountable systems to counter this evolving threat.

Key insights

Generative AI has fundamentally shifted identity document forgery, rendering current detection benchmarks inadequate against advanced attacks.

Principles

Method

The survey systematically unifies attack types, traces detection methodologies, audits public datasets (2019-2025), analyzes large multimodal models, and performs zero-shot benchmarking on unseen synthesized IDs.

In practice

Topics

Best for: CTO, VP of Engineering/Data, Director of AI/ML, AI Security Engineer, AI Scientist, Machine Learning Engineer

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Editorial summary, takeaway, and curation by AIssential. Original article published by Computer Vision and Pattern Recognition.