When Fine-Tuning Changes the Evidence: Architecture-Dependent Semantic Drift in Chest X-Ray Explanations

· Source: Computer Vision and Pattern Recognition · Field: Technology & Digital — Artificial Intelligence & Machine Learning, Computer Vision & Pattern Recognition · Depth: Expert, quick

Summary

A study on medical image classification reveals that fine-tuning deep learning models can lead to "semantic drift," where the visual evidence supporting predictions changes despite stable diagnostic performance. Researchers evaluated DenseNet201, ResNet50V2, and InceptionV3 on a five-class chest X-ray task using a two-stage training protocol. They quantified drift using reference-free metrics for spatial localization and structural consistency of attribution maps. While coarse anatomical localization remained stable across architectures, overlap IoU showed significant architecture-dependent reorganization of evidential structure. The stability rankings of explanation methods like LayerCAM and GradCAM++ also reversed, indicating that explanation stability is an interaction between architecture, optimization phase, and the attribution objective.

Key takeaway

For research scientists developing medical image classification models, you should explicitly evaluate the stability of visual explanations after fine-tuning. Do not assume that stable classification performance implies stable underlying visual reasoning. Incorporate metrics like overlap IoU and compare different attribution methods (e.g., LayerCAM, GradCAM++) to detect architecture-dependent semantic drift, ensuring your model's interpretability remains consistent and reliable.

Key insights

Fine-tuning medical image models can alter visual evidence (semantic drift) even with stable diagnostic accuracy.

Principles

Method

Evaluated DenseNet201, ResNet50V2, InceptionV3 on a five-class chest X-ray task using a two-stage training protocol and quantified semantic drift with reference-free metrics.

In practice

Topics

Best for: Research Scientist, AI Scientist, Machine Learning Engineer, Computer Vision Engineer

Related on AIssential

Open in AIssential →

Editorial summary, takeaway, and curation by AIssential. Original article published by Computer Vision and Pattern Recognition.