Farmland Extent and Visible Boundary Mapping from 1 m NAIP Imagery Using Residual U-Net and Text-Prompted SAM 3 Refinement

· Source: Machine Learning · Field: Technology & Digital — Artificial Intelligence & Machine Learning, Computer Vision · Depth: Advanced, quick

Summary

A reproducible workflow maps farmland extent and visible boundaries using 1 m NAIP RGB imagery. The study utilized 37 diverse scenes, annotated in CVAT, yielding 5,698 256x256 image patches for training (3,850), validation (770), and testing (1,078). A Residual U-Net (ResUNet), trained with a Dice-dominant loss L = 2.5(1 - Dice) + BCE, achieved a test accuracy of 0.8808, IoU of 0.8605, and Dice score of 0.9234. This ResUNet was then fused via logical OR with a frozen SAM 3 branch, prompted by "agricultural farmland field." This fusion significantly improved Dice scores on challenging patches, from 0.858 to 0.955 for orchard rows and from 0.804 to 0.903 for fragmented parcels. The workflow employs sliding-window stitching to produce coherent regional masks, with example tile Dice scores of 0.898 and 0.919. The resulting semantic farmland-extent layer supports agricultural monitoring in areas lacking current field data.

Key takeaway

For agricultural analysts or GIS specialists needing current farmland maps, you should consider this reproducible workflow. It provides a robust method for generating semantic farmland-extent layers from 1 m NAIP imagery. Integrating a Residual U-Net with text-prompted SAM 3 significantly enhances boundary detection accuracy, particularly in challenging, fragmented, or peri-urban agricultural areas. This approach offers a valuable alternative when proprietary field data is incomplete or outdated.

Key insights

Combining a specialized U-Net with text-prompted SAM 3 effectively maps farmland boundaries from NAIP imagery, improving accuracy on complex terrains.

Principles

Method

Annotate 1m NAIP RGB imagery for farmland extent. Train ResUNet with Dice-dominant loss. Fuse ResUNet output with text-prompted SAM 3 via logical OR. Apply sliding-window stitching for regional masks.

In practice

Topics

Best for: Computer Vision Engineer, AI Scientist, Machine Learning Engineer, Research Scientist

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Editorial summary, takeaway, and curation by AIssential. Original article published by Machine Learning.