FusionCell: Cross-Attentive Fusion of Layout Geometry and Netlist Topology for Standard-Cell Performance Prediction

· Source: cs.LG updates on arXiv.org · Field: Technology & Digital — Artificial Intelligence & Machine Learning · Depth: Expert, extended

Summary

FusionCell is a novel dual-modality predictor designed to accelerate standard-cell performance characterization by jointly analyzing routed layout geometry and netlist topology. This model employs a DeiT encoder to process three-layer routed layouts and a graph transformer to model heterogeneous device/net graphs. The key innovation lies in its topology-guided fusion mechanism, where the netlist acts as a structural "map" to query relevant physical regions in the layout, ensuring fine-grained spatial details are interpreted within their correct electrical context. Evaluated on a 7nm dataset built from the ASAP7 PDK, comprising over 19.5k cells across 149 types, FusionCell achieved an average Mean Absolute Percentage Error (MAPE) of 0.92% and superior Spearman/Kendall ranking correlation for six critical metrics: signal rise/fall delay, transition, and power. This approach delivers a 10^4x speedup over traditional circuit simulation.

Key takeaway

For Machine Learning Engineers tasked with accelerating standard-cell characterization, FusionCell provides a robust solution. You should consider integrating its topology-guided multimodal fusion to achieve a 10^4x speedup over traditional simulation while maintaining high accuracy (0.92% MAPE). This enables rapid design space exploration and efficient identification of Pareto-optimal cells, significantly reducing computational costs in your chip design process.

Key insights

Topology-guided fusion of layout geometry and netlist topology accurately predicts standard-cell performance.

Principles

Method

FusionCell uses a DeiT encoder for multi-layer layouts and a graph transformer for heterogeneous netlists. These are fused via topology-guided graph-query/image-key cross-attention, then aggregated for MLP regression.

In practice

Topics

Code references

Best for: AI Scientist, Machine Learning Engineer, Research Scientist

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Editorial summary, takeaway, and curation by AIssential. Original article published by cs.LG updates on arXiv.org.